Atomic Force Microscopy (AFM) is a type of scanning probe microscopy that uses a cantilever with a sharp tip to scan the surface of a sample at the atomic level. AFM provides high-resolution imaging of surface topography, mechanical properties, and molecular interactions. It is widely used in materials science, nanotechnology, and biology for studying surface structures and properties at the nanoscale.<\/p>\n","protected":false},"excerpt":{"rendered":"
Atomic Force Microscopy (AFM) is a type of scanning probe microscopy that uses a cantilever with a sharp tip to<\/p>\n","protected":false},"featured_media":1429,"comment_status":"open","ping_status":"closed","template":"","meta":[],"product_brand":[],"product_cat":[108,91],"product_tag":[],"class_list":["post-1213","product","type-product","status-publish","has-post-thumbnail","product_cat-atomic-force-microscope-en","product_cat-microscopes-products-en","first","instock","shipping-taxable","product-type-simple"],"_links":{"self":[{"href":"https:\/\/sinatip.com.tr\/en\/wp-json\/wp\/v2\/product\/1213","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/sinatip.com.tr\/en\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/sinatip.com.tr\/en\/wp-json\/wp\/v2\/types\/product"}],"replies":[{"embeddable":true,"href":"https:\/\/sinatip.com.tr\/en\/wp-json\/wp\/v2\/comments?post=1213"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/sinatip.com.tr\/en\/wp-json\/wp\/v2\/media\/1429"}],"wp:attachment":[{"href":"https:\/\/sinatip.com.tr\/en\/wp-json\/wp\/v2\/media?parent=1213"}],"wp:term":[{"taxonomy":"product_brand","embeddable":true,"href":"https:\/\/sinatip.com.tr\/en\/wp-json\/wp\/v2\/product_brand?post=1213"},{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/sinatip.com.tr\/en\/wp-json\/wp\/v2\/product_cat?post=1213"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/sinatip.com.tr\/en\/wp-json\/wp\/v2\/product_tag?post=1213"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}